LEED-AES STUDY OF THE AU-SI (100) SYSTEMOURA K; HANAWA T.1979; SURF. SCI.; NLD; DA. 1979; VOL. 82; NO 1; PP. 202-214; BIBL. 18 REF.Article

ELECTRONIC PROPERTIES AND ATOMIC ARRANGEMENT OF THE AG/SI (111) INTERFACEOURA K; TAMINAGA T; HANAWA T et al.1981; SOLID STATE COMMUN.; ISSN 0038-1098; USA; DA. 1981; VOL. 37; NO 6; PP. 523-526; BIBL. 23 REF.Article

THERMALLY INDUCED ACCUMULATION OF SILICON ON PALLADIUM SILICIDE SURFACES AS STUDIED BY AUGER ELECTRON SPECTROSCOPYOURA K; OKADA S; HANAWA T et al.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 9; PP. 705-706; BIBL. 13 REF.Article

A novel method of sputter deposition utilizing a hot-cathode penning ion sourceSHOJI, F; OURA, K.Japanese journal of applied physics. 1990, Vol 29, Num 5, pp L812-L814, issn 0021-4922, 2Article

SURFACE STRUCTURE OF EPITAXIAL PD₂SI THIN FILMS = STRUCTURE DE SURFACE DE COUCHES MINCES EPITAXIQUES DE PD₂SIOURA K; OKADA S; KISHIKAWA Y et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 2; PP. 138-140; BIBL. 25 REF.Article

A STRUCTURE ANALYSIS OF AG-ADSORBED SI(111) SURFACE BY LEED/CMTATERADA Y; YOSHIZUKA T; OURA K et al.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 114; NO 1; PP. 65-84; BIBL. 33 REF.Article

A LEED-AES STUDY OF THIN PD FILMS ON SI(111) AND (100) SUBSTRATESOKADA S; OURA K; HANAWA T et al.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 97; NO 1; PP. 88-100; BIBL. 21 REF.Article

LEED OBSERVATION OF THE PLATINUM INDUCED SUPERSTRUCTURES ON SI SUBSTRATESOKADA S; KISHIKAWA Y; OURA K et al.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 100; NO 2; PP. L457-L460; BIBL. 9 REF.Article

Scattering process of low-energy ions from binary compound surfaces at 180°KAWAMOTO, K; OURA, K.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4929-4931, issn 0021-4922, 1Article

Effects of high-energy ion irradiation on YBa₂Cu₃O_x thin filmsOHNISHI, H; SHOJI, F; OURA, K et al.Technology reports of the Osaka University. 1992, Vol 42, Num 210123, pp 313-319, issn 0030-6177Article

A high energy ion scattering/channeling and low energy ion scattering apparatus for surface analysisSHOJI, F; OURA, K; HANAWA, T et al.Vacuum. 1991, Vol 42, Num 3, pp 189-194, issn 0042-207X, 6 p.Article

Atomic displacements of Si in the Si(111)-(√3×√3)R30°-Ag surface studied by high-energy ion channeling = Déplacements atomiques de Si dans la surface Si (111)-(√3×√3)R30°-Ag étudiée par canalisation d'ions de haute énergieOURA, K; WATAMORI, M; SHOJI, F et al.Physical review. B, Condensed matter. 1988, Vol 38, Num 14, pp 10146-10149, issn 0163-1829Article

Detection of hydrogen on solid surfaces by low-energy recoil ion spectroscopyOURA, K; SHOJI, F; HANAWA, T et al.Japanese journal of applied physics. 1984, Vol 23, Num 9, pp L694-L696, issn 0021-4922, 2Article

A Si(100)-2×1:H monohydride surface studied by low-energy recoil-ion spectroscopySHOJI, F; KUSUMURA, K; OURA, K et al.Surface science. 1993, Vol 280, Num 1-2, pp L247-L252, issn 0039-6028Article

Coadsorption of hydrogen and deuterium on Si(100) surfaces studied by elastic recoil detection analysisNAITOH, M; MORIOKA, H; SHOJI, F et al.Surface science. 1993, Vol 297, Num 2, pp 135-140, issn 0039-6028Article

Low-energy recoil-ion spectroscopy studies of hydrogen adsorption on Si(100)-2×1 surfacesSHOJI, F; KASHIHARA, K; SUMITOMO, K et al.Surface science. 1991, Vol 242, Num 1-3, pp 422-427, issn 0039-6028, 6 p.Conference Paper

Sputter-deposition by a new Penning-discharge source with an axially integrated hot-cathodeSHOJI, F; OGAWA, A; OURA, K et al.Applied surface science. 1991, Vol 48-49, pp 373-376, issn 0169-4332, 4 p.Conference Paper

Elastic recoil detection analysis of the concentration and thermal release of hydrogen in a-Si : H films by the ECR plasma CVD methodUMEZAWA, K; SHOJI, F; HANAWA, T et al.Japanese journal of applied physics. 1990, Vol 29, Num 9, pp 1656-1657, issn 0021-4922, 1Article

An ISS/AES study of surface segregation of Cu-Mn and Cu-Ag alloy films in-situ deposited onto low temperature W substrates = Etude ISS/AES de la ségrégation superficielle des couches d'alliage Cu-Mn et Cu-Ag déposées in situ sur des supports W à basse températureKATAYAMA, I; SHOJI, F; OURA, K et al.Applied surface science. 1988, Vol 33-34, pp 129-137, issn 0169-4332Conference Paper

Real-space determination of atomic structure of the Si(111)-√3×√3R30°-Au surface by low-energy alkali-ion scatteringOURA, K; KATAYAMA, M; SHOJI, F et al.Physical review letters. 1985, Vol 55, Num 14, pp 1486-1489, issn 0031-9007Article

Evidence for solute segregation on Cu-Mn alloy surfaces studied by low-energy ion scattering = Mise en évidence de la ségrégation de soluté sur les surfaces d'alliages Cu-Mn étudiées par diffusion d'ions de faible énergieKATAYAMA, I; OURA, K; SHOJI, F et al.Physical review. B, Condensed matter. 1988, Vol 38, Num 3, pp 2188-2191, issn 0163-1829Article

Cylindrical mirror analyzer (CMA) with an axially integrated ISS-AES gun for surface composition analysisKATAYAMA, I; SHOJI, F; OURA, K et al.Japanese journal of applied physics. 1988, Vol 27, Num 11, pp 2164-2167, issn 0021-4922, 1Article

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

Depth profiling of oxygen concentration of indium tin oxide films fabricated by reactive sputteringHONDA, S; TSUJIMOTO, A; WATAMORI, M et al.Japanese journal of applied physics. 1994, Vol 33, Num 9A, pp L1257-L1260, issn 0021-4922, 2Article

Direct observation of the growth process of Ag thin film on a hydrogen-terminated Si(111) surfaceNAITOH, M; SHOJI, F; OURA, K et al.Japanese journal of applied physics. 1992, Vol 31, Num 12A, pp 4018-4019, issn 0021-4922, 1Article